发明名称 METHOD AND APPARATUS FOR ADJUSTING DEVICE CHARACTERISTICS
摘要 PROBLEM TO BE SOLVED: To surely and easily perform characteristics adjustment of a device in a short time without damaging the substrate of a device or a circuit pattern. SOLUTION: The characteristics adjusting apparatus comprises a vacuum vessel 11 which houses a superconducting band pass filter 10 and acts as a housing means for realizing a vacuum state, a refrigerator 12 which is a cooling means for cooling the superconducting band pass filter 10, a network analyzer 13 of a measuring means for measuring the electric characteristics of the superconducting band pass filter 10, an ion beam source 14 which is arranged above the vacuum vessel 11 and irradiates a circuit pattern 10a of the superconducting band path filter 10 with an argon ion, and a controller 15 of a control means for controlling the operation of the network analyzer 13 and the ion beam source 14. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004207504(A) 申请公布日期 2004.07.22
申请号 JP20020375107 申请日期 2002.12.25
申请人 FUJITSU LTD 发明人 AKASEGAWA AKIHIKO;YAMANAKA KAZUNORI;NAKANISHI TERU
分类号 H01L39/24;H01L39/00;H01P11/00;(IPC1-7):H01L39/24 主分类号 H01L39/24
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