SEMICONDUCTOR TEST SYSTEM WITH EASILY CHANGED INTERFACE UNIT

摘要

A subassembly to aid in changing the interface unit (102) for an automatic test system. The disclosed embodiment shows an automatic test system with a handler (100) and a tester. The interface unit (102) is a device interface board (DIB). The subassembly (110) allows the DIB to be easily accessed, yet can be properly aligned to the test system. No special tools are required to change the DIB.