发明名称 |
Light image sensor test of opto-electronics for in-circuit test |
摘要 |
A method for testing at least one light source on a printed circuit assembly, includes: detecting a light signal from a plurality of light sources on a printed circuit assembly; generating a plurality of electrical analog signals from an image array, in response to each of the detected light signals; multiplexing the plurality of electrical analog signals; digitizing the multiplexed electrical analog signals; and light signals from the image array; and verifying each of the electrical signals in a sequential manner.
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申请公布号 |
US2004135107(A1) |
申请公布日期 |
2004.07.15 |
申请号 |
US20030346046 |
申请日期 |
2003.01.15 |
申请人 |
BENNEWITZ HANS JURGEN;MEYERS ROBERT LOUIS |
发明人 |
BENNEWITZ HANS JURGEN;MEYERS ROBERT LOUIS |
分类号 |
G01V13/00;(IPC1-7):G01V8/00 |
主分类号 |
G01V13/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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