发明名称 Light image sensor test of opto-electronics for in-circuit test
摘要 A method for testing at least one light source on a printed circuit assembly, includes: detecting a light signal from a plurality of light sources on a printed circuit assembly; generating a plurality of electrical analog signals from an image array, in response to each of the detected light signals; multiplexing the plurality of electrical analog signals; digitizing the multiplexed electrical analog signals; and light signals from the image array; and verifying each of the electrical signals in a sequential manner.
申请公布号 US2004135107(A1) 申请公布日期 2004.07.15
申请号 US20030346046 申请日期 2003.01.15
申请人 BENNEWITZ HANS JURGEN;MEYERS ROBERT LOUIS 发明人 BENNEWITZ HANS JURGEN;MEYERS ROBERT LOUIS
分类号 G01V13/00;(IPC1-7):G01V8/00 主分类号 G01V13/00
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