SEMICONDUCTOR MEMORY DEVICE, AND CONTROL METHOD OF SEMICONDUCTOR MEMORY DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor memory device and a control method of a semiconductor memory device by which a testing time can be shortened at the time of a test, while keeping low current consumption operation at the time of normal access operation. SOLUTION: Selecting signals S0-Sn selecting each column block CB0-CBn are generated by block selecting circuits CBS0-CBSn. A strobe signal SS indicating activation timing and column block addresses CAq to CAq+k are inputted to the block selecting circuits CBS0-CBSn. Many block selecting circuits CBS0-CBSn are selected by test block signals ST0-STn from a test block specifying means 1 activated at the time of test access operation comparing with the block selecting circuits CBS0-CBSn selected by the column block addresses CAq-CAq+k, thus more column blocks CB0-CBn can be activated. COPYRIGHT: (C)2004,JPO&NCIPI