发明名称 TESTING APPARATUS AND TESTING METHOD FOR SEMICONDUCTOR STORAGE DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To attain the implementation of an efficient and exact trimming in a short period of time without causing any defect by performing the test while optimizing erasing and writing speeds. <P>SOLUTION: A pulse width is calculated just before erasing and writing are carried out, and the erasing and the writing operation are performed by the optimized pulse width, then the efficient I<SB>ref</SB>trimming test is performed in a short period of time without causing any defect. <P>COPYRIGHT: (C)2004,JPO&NCIPI</p>
申请公布号 JP2004192669(A) 申请公布日期 2004.07.08
申请号 JP20020355932 申请日期 2002.12.06
申请人 FASL JAPAN LTD 发明人 ABE MICHIYASU
分类号 G01R31/28;G11C16/02;G11C29/00;G11C29/56;(IPC1-7):G11C29/00 主分类号 G01R31/28
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