发明名称 |
Method and apparatus for quantitatively evaluating scintillation, antiglare film and method of producing the same |
摘要 |
A method capable of quantitatively evaluating the intensity of scintillation caused by surface unevenness. Light from a white light source is made incident on a surface of an object to be measured through a matrix filter. Reflected light or transmitted light from the object is photographed with a CCD camera and taken into a computer as data. Image processing for the luminance distribution of the captured light is performed to obtain a standard deviation of dispersion of the luminance distribution. The value of the standard deviation obtained is defined as a scintillation value of the surface of the object. The performance of the object is evaluated by judging whether or not the scintillation value is greater than a predetermined value
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申请公布号 |
US2004131245(A1) |
申请公布日期 |
2004.07.08 |
申请号 |
US20030740446 |
申请日期 |
2003.12.22 |
申请人 |
DAI NIPPON PRINTING CO., LTD. |
发明人 |
FURUI GEN |
分类号 |
G01B11/30;G01M11/00;G01N21/00;G01N21/47;G01N21/55;G01N21/57;G01N21/59;G01N21/95;(IPC1-7):G02B27/00 |
主分类号 |
G01B11/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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