| 摘要 |
<p>A method for directly measuring the magnetostriction constant of a magnetoresistive element is provided. The method consists of the following steps: 1) providing a substrate carrying one or more magnetoresistive elements; 2) inserting said substrate into a bending fixture; 3) applying a magnetic DC field parallel to said substrate; 4) applying a magnetic alternating field perpendicular to said substrate and parallel to the magnetoresistive layers of said elements; 5) measuring a signal from said element; 6) applying a mechanical stress parallel to said substrate by bending said substrate; and 7) changing said magnetic DC field until the signal measured before applying said mechanical stress is reached.</p> |
