| 摘要 |
PURPOSE: A test method of a semiconductor memory device is provided to increase channel efficiency of a test equipment using an optimum data input/output pin compression test method. CONSTITUTION: According to the test method of a semiconductor memory device, a test is performed as to a memory cell using a data input/output pin compression test method established with a constant compression ratio(S1). Cells judged as fail in the previous step are replaced with redundancy cells(S2). And the test as to the memory cell is performed using a data input/output pin compression test method established with an optimum compression ratio(S3).
|
