发明名称 |
APPARATUS AND METHOD FOR GRINDING BACKSIDE OF SEMICONDUCTOR WAFER |
摘要 |
PURPOSE: An apparatus and method for grinding the backside of a semiconductor wafer are provided to sustain the uniformity of the backside of the wafer without damage by wet-etching using a nozzle. CONSTITUTION: A chuck(10) is used for spinning a wafer(15) at high speed. A plurality of pins(12) are formed on the chuck to fix stably the wafer. A nozzle(13) is used for spraying chemicals to the backside of the wafer. Nitrogen gas is supplied to a front side of the wafer through an inner path of the chuck, so that the front side of the wafer is protected. The chemicals are sprayed in the range of -20 to 80 mm by using a reference point of the wafer as a base.
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申请公布号 |
KR20040060559(A) |
申请公布日期 |
2004.07.06 |
申请号 |
KR20020087366 |
申请日期 |
2002.12.30 |
申请人 |
DONGBU ELECTRONICS CO., LTD. |
发明人 |
KIM, YEONG SIM;SIM, JUN BEOM |
分类号 |
H01L21/302;(IPC1-7):H01L21/302 |
主分类号 |
H01L21/302 |
代理机构 |
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地址 |
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