发明名称 APPARATUS AND METHOD FOR GRINDING BACKSIDE OF SEMICONDUCTOR WAFER
摘要 PURPOSE: An apparatus and method for grinding the backside of a semiconductor wafer are provided to sustain the uniformity of the backside of the wafer without damage by wet-etching using a nozzle. CONSTITUTION: A chuck(10) is used for spinning a wafer(15) at high speed. A plurality of pins(12) are formed on the chuck to fix stably the wafer. A nozzle(13) is used for spraying chemicals to the backside of the wafer. Nitrogen gas is supplied to a front side of the wafer through an inner path of the chuck, so that the front side of the wafer is protected. The chemicals are sprayed in the range of -20 to 80 mm by using a reference point of the wafer as a base.
申请公布号 KR20040060559(A) 申请公布日期 2004.07.06
申请号 KR20020087366 申请日期 2002.12.30
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 KIM, YEONG SIM;SIM, JUN BEOM
分类号 H01L21/302;(IPC1-7):H01L21/302 主分类号 H01L21/302
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