发明名称 TEST MODE CIRCUIT FOR ADJUSTING CAPACITANCE
摘要 PURPOSE: A test mode circuit is provided to adjust capacitance by comprising a capacitance adjustment logic. CONSTITUTION: A switching group comprises a plurality of switching devices which are controlled by a control signal and are connected to the first voltage line in parallel. A capacitance group comprises a plurality of capacitances(C3,C4,C5) which are connected between the switching group and the second voltage line lower than the first voltage line correspondingly and perform a charging operation when the plurality of switching devices are turned on.
申请公布号 KR20040060170(A) 申请公布日期 2004.07.06
申请号 KR20020086705 申请日期 2002.12.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, SANG HO
分类号 G11C5/10;(IPC1-7):G11C5/10 主分类号 G11C5/10
代理机构 代理人
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