发明名称 |
FLASH MEMORY DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A flash memory device and a manufacturing method thereof are provided to restrain electron transfer by dividing a tunnel nitride layer into nitride patterns and to adjust easily the interval between the nitride patterns by using a spacer as an etching mask. CONSTITUTION: A nitride layer, a sacrificial oxide layer(51) and a hard mask layer(53) are sequentially deposited on the first oxide layer(40). A photoresist pattern with a predetermined window is formed on the hard mask layer. A hard mask pattern is formed by performing RIE(Reactive Ion Etching) on the hard mask layer under CF4 gas atmosphere using the photoresist pattern as an etching mask. At this time, a spacer(57) is formed at sidewalls of the hard mask pattern. The nitride layer is divided into nitride patterns(50a,50b) by etching using the spacer and the hard mask pattern as an etching mask.
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申请公布号 |
KR20040059277(A) |
申请公布日期 |
2004.07.05 |
申请号 |
KR20020085871 |
申请日期 |
2002.12.28 |
申请人 |
DONGBU ELECTRONICS CO., LTD. |
发明人 |
HAN, CHANG HUN;KIM, BONG GIL |
分类号 |
H01L21/8247;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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