发明名称 FLASH MEMORY DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A flash memory device and a manufacturing method thereof are provided to restrain electron transfer by dividing a tunnel nitride layer into nitride patterns and to adjust easily the interval between the nitride patterns by using a spacer as an etching mask. CONSTITUTION: A nitride layer, a sacrificial oxide layer(51) and a hard mask layer(53) are sequentially deposited on the first oxide layer(40). A photoresist pattern with a predetermined window is formed on the hard mask layer. A hard mask pattern is formed by performing RIE(Reactive Ion Etching) on the hard mask layer under CF4 gas atmosphere using the photoresist pattern as an etching mask. At this time, a spacer(57) is formed at sidewalls of the hard mask pattern. The nitride layer is divided into nitride patterns(50a,50b) by etching using the spacer and the hard mask pattern as an etching mask.
申请公布号 KR20040059277(A) 申请公布日期 2004.07.05
申请号 KR20020085871 申请日期 2002.12.28
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 HAN, CHANG HUN;KIM, BONG GIL
分类号 H01L21/8247;(IPC1-7):H01L21/824 主分类号 H01L21/8247
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