发明名称 METHOD FOR FORMING CAPACITOR OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a capacitor of a semiconductor device is provided to prevent collapse of a storage node pattern by using doped silicate glass layers with different dose. CONSTITUTION: A heavily doped first PSG layer(21) and a lightly doped second PSG layer(22) are sequentially formed on a substrate. An insulating layer(23) made of PE-TEOS(Plasma Enhanced Tetra Ethyl Ortho Silicate) is formed on the second PSG layer. A storage node forming region is defined by selectively etching the PE-TEOS layer, the second and first PSG layers. The defined storage node forming region is cleaned. A storage node pattern is formed by forming a polysilicon layer(24) on the storage node forming region.
申请公布号 KR20040059397(A) 申请公布日期 2004.07.05
申请号 KR20020086012 申请日期 2002.12.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KOO, DONG CHEOL;LEE, WON CHEOL
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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