发明名称 |
METHOD FOR FORMING CAPACITOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming a capacitor of a semiconductor device is provided to prevent collapse of a storage node pattern by using doped silicate glass layers with different dose. CONSTITUTION: A heavily doped first PSG layer(21) and a lightly doped second PSG layer(22) are sequentially formed on a substrate. An insulating layer(23) made of PE-TEOS(Plasma Enhanced Tetra Ethyl Ortho Silicate) is formed on the second PSG layer. A storage node forming region is defined by selectively etching the PE-TEOS layer, the second and first PSG layers. The defined storage node forming region is cleaned. A storage node pattern is formed by forming a polysilicon layer(24) on the storage node forming region.
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申请公布号 |
KR20040059397(A) |
申请公布日期 |
2004.07.05 |
申请号 |
KR20020086012 |
申请日期 |
2002.12.28 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KOO, DONG CHEOL;LEE, WON CHEOL |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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