发明名称 CONNECTION STRUCTURE OF CIRCUIT BOARD
摘要 PROBLEM TO BE SOLVED: To facilitate GO/NO-GO test of the shift between opposing electrodes by an electric short/open test in a circuit board. SOLUTION: When an electrode terminal group 12 on the first circuit board 10 side and an electrode terminal group 20 on the second circuit board 20 side are connected electrically and mechanically through an anisotropic conductive material, shift detection electrodes 41L and 41R having an allowable width narrower than that of end part electrode terminals 22a and 22n are formed, for each of the end part electrode terminals 22a and 22n included in any one electrode terminal group, e.g. the electrode terminal group 20, in the extension area of the end part electrode terminal defined by an inner edge extension line along the inner edge IE on the central side of the electrode terminal group of that end part electrode terminal and an outer edge extension line along the outer edge OE of the end part electrode terminal and in an area where the opposite end part electrode terminals 12a and 12n included in the other electrode terminal group 12 are superposed. GO/NO-GO test of the shift can be effected by short/open test between the end part electrode terminal 22a and the shift detection electrode 41L and between the end part electrode terminal 22n and the shift detection electrode 41R. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004186169(A) 申请公布日期 2004.07.02
申请号 JP20020347660 申请日期 2002.11.29
申请人 OPTREX CORP 发明人 NAKADO HIROYUKI;TAKAHIRA HIROSHI
分类号 H01L21/60;(IPC1-7):H01L21/60 主分类号 H01L21/60
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