发明名称 SUBSTRATE PROCESSING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a substrate processing apparatus which can accurately control a reflow distance L to a desired value. SOLUTION: Gas is blown from a gas diffusing part formed on the outer wall of a diffusing member 23 having a hollow part into a chamber 101. Further, the gas is blown to the substrate 1 through the openings 211 formed on a gas blow out plate 21. Since the gas is made in concentration uniform in the diffusing member 23 and is blown uniformly onto the substrate 1 via the gas blow out plate 21, the reflow distance L can be accurately controlled over the entire surface of the substrate 1. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004186706(A) 申请公布日期 2004.07.02
申请号 JP20040042530 申请日期 2004.02.19
申请人 NEC KAGOSHIMA LTD 发明人 KIDO SHUSAKU;IIO YOSHIHIDE;IKEDA MASAKI
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
代理机构 代理人
主权项
地址