发明名称 MANUFACTURING APPARATUS FOR SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing apparatus for semiconductor device which assures sufficient corrosion-proof characteristic for the corrosive gas and can produce semiconductor device at lower cost in comparison with the apparatus using individual platinum and tantalum or the like. SOLUTION: As the mother material, stainless steel is used, while as a corrosion-proof metal at the surface to be in contact with gas, tantalum is used, respectively. Moreover, a binder metal is also provided between the mother material and the corrosion-proof metal. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004186284(A) 申请公布日期 2004.07.02
申请号 JP20020349338 申请日期 2002.12.02
申请人 CONTAMINATION CONTROL SERVICE:KK 发明人 SHINDO TOYOHIKO
分类号 H01L21/205;(IPC1-7):H01L21/205 主分类号 H01L21/205
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