发明名称 Process for forming trenches with oblique profile and rounded top corners
摘要 A process for forming trenches with an oblique profile and rounded top corners, including the steps of: in a semiconductor wafer, through a first polymerizing etch, forming depressions delimited by rounded top corners; and through a second polymerizing etch, opening trenches at the depressions. The second polymerizing etch is made in variable plasma conditions, so that the trenches have oblique walls with a constant slope.
申请公布号 US2004124494(A1) 申请公布日期 2004.07.01
申请号 US20030608855 申请日期 2003.06.27
申请人 STMICROELECTRONICS S.R.I. 发明人 CIOVACCO FRANCESCO;SAVARDI CHIARA;COLOMBO ROBERTO
分类号 H01L21/3065;H01L21/308;H01L21/762;(IPC1-7):H01L29/00 主分类号 H01L21/3065
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