| 摘要 |
PURPOSE: An apparatus for inspecting a shield for an IC of a PCB and an inspecting method thereof are provided to reduce errors by using a camera measurement device and a laser beam source. CONSTITUTION: A shield induction conveyer(100) is used for receiving a completed shield from a shield assembly unit. A horizontal transfer unit(200) is formed with a horizontal transfer bar, a horizontal transfer part, a plurality of camera measurement devices, and a discharging device. A transfer switch unit(300) is formed with a horizontal stopper for stopping a horizontal transfer operation and a push bar for moving the stopped shield. A vertical transfer unit(400) is formed with a vertical transfer bar, a vertical transfer part, a plurality of camera measurement devices, and a discharging device. A bottom measurement unit(500) is installed at one or more of the horizontal transfer unit and the vertical transfer unit.
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