| 发明名称 |
DEVICE FOR FIXING A MEASURING PROBE FOR A SCANNING FORCE MICROSCOPE |
| 摘要 |
<p>The invention relates to a probe ( 207 ) mounting device for a scanning probe microscope, especially a scanning force microscope, comprising a retaining member ( 200 ) for installation in a measuring assembly of a scanning probe microscope. The probe ( 207 ) is detachably mounted on the retaining member ( 200 ) by means of a clamping member ( 201 ), the clamping member being secured in self-locking fashion to the retaining member ( 200 ).</p> |
| 申请公布号 |
EP1433184(A1) |
申请公布日期 |
2004.06.30 |
| 申请号 |
EP20020776746 |
申请日期 |
2002.09.24 |
| 申请人 |
JPK INSTRUMENTS AG |
发明人 |
SUENWOLDT, OLAF;HASCHKE, HEIKO |
| 分类号 |
G01Q70/02;B82Y35/00;G01Q30/14;(IPC1-7):G12B21/00;G01B7/34;G01N27/00;G11B9/00 |
主分类号 |
G01Q70/02 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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