发明名称 |
Electro-static discharge protection device for integrated circuit inputs |
摘要 |
ESD protection device for integrated circuit includes: A MOS transistor is connected between a supply potential and a ground potential for PD and ND ESD modes. A first-level protection device, such as a field oxide device, has an input terminal coupled to the input pad and an output terminal coupled to the ground potential. The output terminal of the first-level protection device is shared with the MOS transistor for saving layout area. The first-level protection device provides passing the ESD current from the input pad into the MOS transistor when the ground potential is floating.
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申请公布号 |
US6757148(B2) |
申请公布日期 |
2004.06.29 |
申请号 |
US20020123411 |
申请日期 |
2002.04.17 |
申请人 |
WINBOND ELECTRONICS CORPORATION |
发明人 |
MIAW JIUNN-WAY |
分类号 |
H01L27/02;(IPC1-7):H02H9/00 |
主分类号 |
H01L27/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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