Method for manufacturing smart card and identification devices and the like

摘要

An automatic test system for testing smart card chips. The system includes synchronization circuitry that allows response signals generated at random times after a stimulus to be synchronized with a pattern generator. The described system has multiple paths in the synchronization circuitry that allows responses from several devices under test to be synchronized with each other so that parallel testing is supported. The system is well adapted for testing of smart card chips because such chips often respond to stimulus at random times. Other adaptations are included for testing of smart card chips. These adaptations include circuitry to generate a modulated RF carrier signal and signal processing circuitry that can detect modulation imposed on the RF carrier, allowing the smart card chip to be tested without modifications to the device for test access.