发明名称 |
CHEMICAL MECHANICAL POLISHING EQUIPMENT AND SLURRY SUPPLY APPARATUS THEREOF |
摘要 |
PURPOSE: A CMP(Chemical Mechanical Polishing) equipment and a slurry supply apparatus thereof are provided to uniformly polish a wafer by using at least one movable nozzle. CONSTITUTION: A CMP equipment is provided with a platen(2) for being attached with a polishing pad(4), a conditioner(16) installed on the platen for conditioning the polishing pad, and a polishing head(12) installed at the upper portion of the resultant structure for loading a wafer and pressurizing the wafer downward. The CMP equipment further includes a slurry supply apparatus(20) for supplying slurry from at least one position to the wafer. At this time, the slurry supply apparatus includes at least one movable nozzle(22).
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申请公布号 |
KR20040054254(A) |
申请公布日期 |
2004.06.25 |
申请号 |
KR20020081101 |
申请日期 |
2002.12.18 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
JUN, CHAN UN;JUNG, MYEONG JIN |
分类号 |
H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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