发明名称 METHOD AND APPARATUS FOR INSPECTING QUALITY OF NON-SCATTERING GRID OF DIGITAL RADIATION SYSTEM USING X-RAY FILM AND FILM DIGITIZER
摘要 PURPOSE: A method and an apparatus for inspecting quality of a non-scattering grid of a digital radiation system using an X-ray film and a film digitizer are provided to convert an analog image of an X-ray film to a digital image by using the film digitizer. CONSTITUTION: A fixing frame(10) includes an alignment point and an alignment support unit. The alignment point(13) is formed at a corner part of the fixing frame in order to improve reproduction of an X-ray image. The alignment support unit is projected from both sides of a front side of the fixing frame. A film digitizer is used for scanning the image. The quality of a non-scattering grid of a digital radiation system is inspected by using a programmed algorithm of a computer.
申请公布号 KR20040054190(A) 申请公布日期 2004.06.25
申请号 KR20020081010 申请日期 2002.12.18
申请人 JEONGWON PRECISION IND.CO., LTD. 发明人 KIM, SAM JO;LEE, HYEONG GU
分类号 A61B6/06;(IPC1-7):A61B6/06 主分类号 A61B6/06
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