发明名称 |
METHOD AND APPARATUS FOR INSPECTING QUALITY OF NON-SCATTERING GRID OF DIGITAL RADIATION SYSTEM USING X-RAY FILM AND FILM DIGITIZER |
摘要 |
PURPOSE: A method and an apparatus for inspecting quality of a non-scattering grid of a digital radiation system using an X-ray film and a film digitizer are provided to convert an analog image of an X-ray film to a digital image by using the film digitizer. CONSTITUTION: A fixing frame(10) includes an alignment point and an alignment support unit. The alignment point(13) is formed at a corner part of the fixing frame in order to improve reproduction of an X-ray image. The alignment support unit is projected from both sides of a front side of the fixing frame. A film digitizer is used for scanning the image. The quality of a non-scattering grid of a digital radiation system is inspected by using a programmed algorithm of a computer.
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申请公布号 |
KR20040054190(A) |
申请公布日期 |
2004.06.25 |
申请号 |
KR20020081010 |
申请日期 |
2002.12.18 |
申请人 |
JEONGWON PRECISION IND.CO., LTD. |
发明人 |
KIM, SAM JO;LEE, HYEONG GU |
分类号 |
A61B6/06;(IPC1-7):A61B6/06 |
主分类号 |
A61B6/06 |
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