Integrated circuit has Hall probe structure arranged close to conducting track so Hall voltage dependent on measurement voltage can be measured depending on magnetic field caused by track current

摘要

The integrated circuit has a measurement structure for measuring a current in a circuit. The measurement structure has a conducting track (1,2) in which the current flows and a Hall probe structure (4) carrying a defined measurement current and arranged close to the conducting track so that a Hall voltage (UH), which is dependent on the measurement voltage, can be measured depending on the magnetic field caused by the track current. AN Independent claim is also included for the following: (a) an a method of measuring a current in a circuit in an integrated circuit.