发明名称 |
METHOD FOR MANUFACTURING CAPACITOR HAVING STACK DIELECTRIC LAYER MADE OF ALUMINA LAYER AND HfO2 LAYER |
摘要 |
PURPOSE: A method for manufacturing a capacitor having a stack dielectric layer made of an alumina layer and an HfO2 layer is provided to remove the deoxidized metal between the alumina and HfO2 layer by carrying out a plasma treatment. CONSTITUTION: A lower electrode made of a polysilicon layer is formed on a predetermined structure(S1). An alumina layer is formed on the lower electrode(S3). A thin HfO2 layer is firstly deposited on the alumina layer(S4). A plasma treatment is carried out on the resultant structure for removing the deoxidized metal between the alumina layer and the thin HfO2 layer(S5). A thick HfO2 layer is secondly deposited on the thin HfO2 layer(S6). A post heat treatment is carried out on the resultant structure at a high temperature for securing dielectric characteristics(S7). An upper electrode is formed on the thick HfO2 layer(S8).
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申请公布号 |
KR20040051298(A) |
申请公布日期 |
2004.06.18 |
申请号 |
KR20020079201 |
申请日期 |
2002.12.12 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, GYEONG MIN;PARK, JONG BEOM |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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