发明名称 METHOD FOR MANUFACTURING CAPACITOR HAVING STACK DIELECTRIC LAYER MADE OF ALUMINA LAYER AND HfO2 LAYER
摘要 PURPOSE: A method for manufacturing a capacitor having a stack dielectric layer made of an alumina layer and an HfO2 layer is provided to remove the deoxidized metal between the alumina and HfO2 layer by carrying out a plasma treatment. CONSTITUTION: A lower electrode made of a polysilicon layer is formed on a predetermined structure(S1). An alumina layer is formed on the lower electrode(S3). A thin HfO2 layer is firstly deposited on the alumina layer(S4). A plasma treatment is carried out on the resultant structure for removing the deoxidized metal between the alumina layer and the thin HfO2 layer(S5). A thick HfO2 layer is secondly deposited on the thin HfO2 layer(S6). A post heat treatment is carried out on the resultant structure at a high temperature for securing dielectric characteristics(S7). An upper electrode is formed on the thick HfO2 layer(S8).
申请公布号 KR20040051298(A) 申请公布日期 2004.06.18
申请号 KR20020079201 申请日期 2002.12.12
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, GYEONG MIN;PARK, JONG BEOM
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
代理机构 代理人
主权项
地址