| 摘要 |
PROBLEM TO BE SOLVED: To supply a testing waveform excellent in waveform quality to a device to be measured. SOLUTION: An output voltage setting circuit 50 of the driver 102 has setting voltages (VH2, VL2) corresponding to logic levels of an I/O signal interface of the device to be measured, and setting voltages (VH1, VL1) different from the setting voltages (VH2, VL2). An output voltage switching circuit 60 selects and outputs one of the setting voltages based on a selection signal from an edge control circuit 20. When pattern data turning to reference of the testing waveform changes, the setting voltages (VH2, VL2) are output to the device to be measured, after the setting voltages (VH1, VL1) are output to the device. The setting voltages (VH1, VL1) are set as arbitrary values by the output voltage setting circuit 50. A switch time to the setting voltage (VH2, VL2) is adjusted by changing the amount of delay of a delay circuit 40 by control of a delay amount control circuit 30. COPYRIGHT: (C)2004,JPO
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