发明名称 |
POSITIVE RESIST COMPOSITION |
摘要 |
<p>A positive resist composition which is used in a process for forming a resist pattern involving the steps of alkali developing, replacing a liquid present on a substrate with a liquid for use in the critical drying, and then drying the liquid for use in the critical drying via a critical state, in a lithography technology, which comprises a resin component (A) containing an alkali-soluble unit in an mount less than 20 mol % and having an acid-dissociative group inhibiting the dissolution thereof in an alkali and thus exhibiting the enhancement in the solubility in an alkaline solution by the action of an acid, a component (B) generating an acid by the exposure to a light, and an organic solvent (C) capable of dissolving (A) and (B) components, wherein the (A) component comprises (a1) a constituting unit containing acid-dissociative group inhibiting the dissolution thereof in an alkali, (a2) a constituting unit containing a lactone unit and (a3) a constituting unit containing a polycyclic group having an alcoholic hydroxyl group. The positive resist composition can be used for preventing a fine resist pattern from falling down in a drying step after developing.</p> |
申请公布号 |
WO2004051375(A1) |
申请公布日期 |
2004.06.17 |
申请号 |
WO2003JP15346 |
申请日期 |
2003.12.01 |
申请人 |
TOKYO OHKA KOGYO CO., LTD.;KUBOTA, NAOTAKA;ISHIKAWA, KIYOSHI;SATO, MITSURU;MATSUMIYA, TASUKU |
发明人 |
KUBOTA, NAOTAKA;ISHIKAWA, KIYOSHI;SATO, MITSURU;MATSUMIYA, TASUKU |
分类号 |
G03F7/039;G03F7/32;G03F7/40;H01L21/027;(IPC1-7):G03F7/039;G03F7/004 |
主分类号 |
G03F7/039 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|