发明名称 |
Semiconductor memory device having shortened testing time |
摘要 |
The period of time required for a parallel test can be shortened by widening the application range of the parallel test. In the semiconductor memory device having memory cell portions, there are provided a column controller that simultaneously activates a plurality of columns which are subject to degenerate substitution in a column redundant substitution; and a data read-out circuit that simultaneously reads out the data from a plurality of memory cells as selected by the above plurality of columns.
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申请公布号 |
US6751128(B2) |
申请公布日期 |
2004.06.15 |
申请号 |
US20020106351 |
申请日期 |
2002.03.27 |
申请人 |
OKI ELECTRIC INDUSTRY CO., LTD. |
发明人 |
KUROKI KOJI;NOGUCHI HIDEKAZU |
分类号 |
G11C11/401;G11C29/04;G11C29/28;G11C29/34;(IPC1-7):G11C7/00 |
主分类号 |
G11C11/401 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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