发明名称 Method for fabricating a thin-membrane stencil mask and method for making a semiconductor device using the same
摘要 A stencil mask (12 or 12') has both a thin membrane layer (106) and a stress controlled layer (104) for enabling electron and ion projection lithography at very small geometries. The thin membrane layer (106) is within a range of substantially forty to two hundred nanometers and is preferably silicon nitride, and the stress controlled layer is preferably a metal or a metal alloy. Annealing of the stress controlled layer (104) may be performed to obtain a desired stress characteristic. Semiconductors are made using the mask by projecting radiation through the thin membrane stencil mask and reduction optics (30) onto resist (44) formed on a plurality of die, the radiation forming a contrast image on the resist that is subsequently developed. Commercially available lithography equipment is compatible with the thin stencil mask.
申请公布号 US6749968(B2) 申请公布日期 2004.06.15
申请号 US20010927024 申请日期 2001.08.09
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 MANGAT PAWITTER;MOGAB JOE;SMITH KENNETH H.;WASSON JAMES R.
分类号 G03F1/16;(IPC1-7):G03F9/00 主分类号 G03F1/16
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