发明名称 |
Method for fabricating a thin-membrane stencil mask and method for making a semiconductor device using the same |
摘要 |
A stencil mask (12 or 12') has both a thin membrane layer (106) and a stress controlled layer (104) for enabling electron and ion projection lithography at very small geometries. The thin membrane layer (106) is within a range of substantially forty to two hundred nanometers and is preferably silicon nitride, and the stress controlled layer is preferably a metal or a metal alloy. Annealing of the stress controlled layer (104) may be performed to obtain a desired stress characteristic. Semiconductors are made using the mask by projecting radiation through the thin membrane stencil mask and reduction optics (30) onto resist (44) formed on a plurality of die, the radiation forming a contrast image on the resist that is subsequently developed. Commercially available lithography equipment is compatible with the thin stencil mask.
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申请公布号 |
US6749968(B2) |
申请公布日期 |
2004.06.15 |
申请号 |
US20010927024 |
申请日期 |
2001.08.09 |
申请人 |
FREESCALE SEMICONDUCTOR, INC. |
发明人 |
MANGAT PAWITTER;MOGAB JOE;SMITH KENNETH H.;WASSON JAMES R. |
分类号 |
G03F1/16;(IPC1-7):G03F9/00 |
主分类号 |
G03F1/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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