发明名称 |
SBD BUFFER HAVING SELF TEST CIRCUIT WITH INPUT SIGNAL GENERATING FUNCTION AND SELF TEST METHOD OF THE SAME |
摘要 |
PURPOSE: An SBD(Simultaneous Bi-Directional) buffer having a self test circuit with an input signal generating function and a self test method of the SBD buffer are provided to improve the performance test accuracy of the SBD buffer by generating an input signal on performing a self test. CONSTITUTION: An output driver(120) receives an output data and outputs it to an input/output node. An input receiver(140) receives input data and output data which are combined from the input/output node, and compares the signal with a predetermined reference voltage to output it. A first multiplexer(130) outputs the predetermined voltage in response to a reference voltage selecting signal. An input signal generating circuit(110) generates an input signal for a test in a test mode to output it as the input data.
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申请公布号 |
KR20040049173(A) |
申请公布日期 |
2004.06.11 |
申请号 |
KR20020077033 |
申请日期 |
2002.12.05 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHOI, JEONG HWAN;SEO, HUI YEONG |
分类号 |
G01R31/317;(IPC1-7):G11C7/10 |
主分类号 |
G01R31/317 |
代理机构 |
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主权项 |
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