发明名称 SBD BUFFER HAVING SELF TEST CIRCUIT WITH INPUT SIGNAL GENERATING FUNCTION AND SELF TEST METHOD OF THE SAME
摘要 PURPOSE: An SBD(Simultaneous Bi-Directional) buffer having a self test circuit with an input signal generating function and a self test method of the SBD buffer are provided to improve the performance test accuracy of the SBD buffer by generating an input signal on performing a self test. CONSTITUTION: An output driver(120) receives an output data and outputs it to an input/output node. An input receiver(140) receives input data and output data which are combined from the input/output node, and compares the signal with a predetermined reference voltage to output it. A first multiplexer(130) outputs the predetermined voltage in response to a reference voltage selecting signal. An input signal generating circuit(110) generates an input signal for a test in a test mode to output it as the input data.
申请公布号 KR20040049173(A) 申请公布日期 2004.06.11
申请号 KR20020077033 申请日期 2002.12.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, JEONG HWAN;SEO, HUI YEONG
分类号 G01R31/317;(IPC1-7):G11C7/10 主分类号 G01R31/317
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