发明名称 Beam centering and angle calibration for X-ray reflectometry
摘要 A method for testing a surface of a sample includes irradiating the surface at a grazing incidence with a beam of radiation having a focal region, whereby the radiation is reflected from the surface. At least one of the focal region and the sample is adjusted through a plurality of adjustment stages within an adjustment range so as to vary a location of the focal region relative to the surface. Respective angular profiles of the radiation reflected from the surface are measured at the plurality of adjustment stages, and the angular profiles are compared in order to select an adjustment within the range at which the surface is in a desired alignment with the beam.
申请公布号 US2004109531(A1) 申请公布日期 2004.06.10
申请号 US20020313280 申请日期 2002.12.06
申请人 YOKHIN BORIS;MAZOR ISAAC;BERMAN DAVID 发明人 YOKHIN BORIS;MAZOR ISAAC;BERMAN DAVID
分类号 G01B15/00;G01B15/08;G01N23/20;G01N23/201;(IPC1-7):G01B15/02 主分类号 G01B15/00
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