| 摘要 |
PROBLEM TO BE SOLVED: To provide a method of measuring a laminated substrate for high frequency use in which an element is scheduled to be mounted externally, capable of measuring the substrate precisely even in the state before mounting the element externally. SOLUTION: The measuring subject of this method is composed of input/output terminals 83, 84, and the laminated substrate 80 with a pad without mounting the external element to be mounted for constituting a high frequency module together with the laminated substrate 80. Measuring jigs 2, 10 are prepared while providing a pair of measuring terminals 11 corresponding to input/output terminals 83, 84, and substitution circuit elements 51' which substitute the external elements to be mounted on the pad. Under this state the measuring jigs 2, 10 are fixed in an attachable/detachable way to the laminated substrate 80, while the measuring terminals 11 make a continuity with the input/output terminals 83, 84 and also connecting the terminal parts of the substitution elements 51 with the pad to be mounted with the external elements. Under the situation, A measurement for the characteristics of the high frequency circuit is performed by inputting a measuring signal via the measuring terminals 11 from a network analyzer 17 to the high frequency circuit composed of the high frequency laminated substrate 80 and the substitution circuit elements from input/output terminals 83, and 84. COPYRIGHT: (C)2004,JPO
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