发明名称 |
DEVICE MANUFACTURING EQUIPMENT AND DEVICE MANUFACTURING METHOD, ELECTRONIC INSTRUMENT |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide device manufacturing equipment which can manufacture a device with desired performance capable of preventing dot defects by detecting a nonaction nozzle without reducing the throughput in manufacturing the device with a liquid drop ejection method. <P>SOLUTION: The device manufacturing equipment IJ is provided with an ejection head 1 for ejecting a liquid containing a functional material, a stage apparatus 2 supporting a substrate P to which the liquid is ejected and capable of moving relatively to the ejection head 1, a transfer apparatus 3 for transferring the substrate P, a detector 30 for detecting ejection conditions of the liquid ejected through a ejection nozzle 11 formed on the ejection head 1, and a control device CONT for implementing the detection operation with the detector 30. <P>COPYRIGHT: (C)2004,JPO</p> |
申请公布号 |
JP2004160449(A) |
申请公布日期 |
2004.06.10 |
申请号 |
JP20030301295 |
申请日期 |
2003.08.26 |
申请人 |
SEIKO EPSON CORP |
发明人 |
KAMIYAMA NOBUAKI;TAKAHASHI HAYATO |
分类号 |
G02F1/13;B05C5/00;B05C11/10;B41J2/125;B41J29/393;H01J9/02;H01J9/227;H01J11/12;H01J11/22;H01J11/24;H01J11/26;H01J11/34;H01J11/42;H01L21/00;H01L21/027;H01L51/50;H05B33/10;(IPC1-7):B05C5/00;H01J11/02;H05B33/14 |
主分类号 |
G02F1/13 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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