Robust system reliability via systolic manufacturing level chip test operating real time on microprocessors/ systems

摘要

A method and system are disclosed for running a manufacturing-level test program on an installed processor by interrupting processor execution of a non-test process. Periodic execution of the manufacturing-level test program allows the processor to continually self-test during normal function operation, in order to facilitate proper maintenance and function of the processor and a data processing system of which the processor is a part.