发明名称 SEMICONDUCTOR MEMORY DEVICE AND SEMICONDUCTOR INTEGRATED CIRCUIT, IN WHICH CELL SIZE IS MINIMIZED
摘要 PURPOSE: A semiconductor memory device and a semiconductor integrated circuit are provided to reduce cell area and to write a logic value '0' properly and to reduce a standby current and also to improve an operation speed. CONSTITUTION: A memory unit is constituted by connecting n-channel MOS transistors(305,306). A source electrode of the n-channel MOS transistors is connected to a low potential power supply voltage(VSS). A drain electrode of the n-channel MOS transistor(305) and a gate electrode of the n-channel MOS transistor(306) become the first node(N3) of the memory unit, and the first node is connected to a bit line(BLT) through a p-channel MOS transistor(301). A drain electrode of the n-channel MOS transistor(306) and a gate electrode of the n-channel MOS transistor(305) become the second node(N4), and the second node is connected to a bit line(BLB) through a p-channel MOS transistor(302). The p-channel MOS transistor(301) is stacked on the n-channel MOS transistor(305), and the p-channel MOS transistor(302) is stacked on the n-channel MOS transistor(306).
申请公布号 KR20040047712(A) 申请公布日期 2004.06.05
申请号 KR20030085364 申请日期 2003.11.28
申请人 RENESAS TECHNOLOGY CORP. 发明人 TAKAHASHI YASUHIKO;TANAKA TAKAYUKI
分类号 G11C11/41;G11C11/412;H01L21/8244;H01L27/11;H01L27/12;(IPC1-7):G11C11/41 主分类号 G11C11/41
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