发明名称 |
SEMICONDUCTOR MEMORY DEVICE AND SEMICONDUCTOR INTEGRATED CIRCUIT, IN WHICH CELL SIZE IS MINIMIZED |
摘要 |
PURPOSE: A semiconductor memory device and a semiconductor integrated circuit are provided to reduce cell area and to write a logic value '0' properly and to reduce a standby current and also to improve an operation speed. CONSTITUTION: A memory unit is constituted by connecting n-channel MOS transistors(305,306). A source electrode of the n-channel MOS transistors is connected to a low potential power supply voltage(VSS). A drain electrode of the n-channel MOS transistor(305) and a gate electrode of the n-channel MOS transistor(306) become the first node(N3) of the memory unit, and the first node is connected to a bit line(BLT) through a p-channel MOS transistor(301). A drain electrode of the n-channel MOS transistor(306) and a gate electrode of the n-channel MOS transistor(305) become the second node(N4), and the second node is connected to a bit line(BLB) through a p-channel MOS transistor(302). The p-channel MOS transistor(301) is stacked on the n-channel MOS transistor(305), and the p-channel MOS transistor(302) is stacked on the n-channel MOS transistor(306).
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申请公布号 |
KR20040047712(A) |
申请公布日期 |
2004.06.05 |
申请号 |
KR20030085364 |
申请日期 |
2003.11.28 |
申请人 |
RENESAS TECHNOLOGY CORP. |
发明人 |
TAKAHASHI YASUHIKO;TANAKA TAKAYUKI |
分类号 |
G11C11/41;G11C11/412;H01L21/8244;H01L27/11;H01L27/12;(IPC1-7):G11C11/41 |
主分类号 |
G11C11/41 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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