发明名称 ENHANCED HIGH-FREQUENCY VIA INTERCONNECTION FOR IMPROVED MECHANICAL/ELECTRIC RELIABILITY OF FEATURE MOUNTED ON SURFACE
摘要 PURPOSE: An enhanced high-frequency via interconnection for improving reliability is provided to reduce a leakage and a parasite capacitance of a multi-layer ceramic substrate during a high-frequency operation by reducing the number of vias related to an interlayer connector. CONSTITUTION: A plurality of ceramic layers includes conductors thereon. The ceramic layers include a first outer layer(12) and a second layer(16) adjacent to the first outer layer. Each of the first outer layer and the second layer has a center location. A plurality of vias(14) are extended from the first outer layer to the second layer. A plurality of metal straps correspond to the vias and contact the vias. The first outer layer includes a plurality of contact pads, each of which is electrically connected to a portion of the vias. Each of the metallic straps connects to a single via(18), such that each of the portion of the vias is electrically connected to the single via of the metallic strap.
申请公布号 KR20040047566(A) 申请公布日期 2004.06.05
申请号 KR20030074117 申请日期 2003.10.23
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 JOZWIAK JANET;MARTIN GREGORY;RAPP LINDA;REDDY SRINIVASA
分类号 H01L23/12;H01L23/498;H05K1/02;H05K1/03;H05K1/11;(IPC1-7):H01L23/12 主分类号 H01L23/12
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