| 摘要 |
PROBLEM TO BE SOLVED: To independently change the functioning period of a device and a test time by making autoreflesh capable. SOLUTION: When a test pattern showing moving to a subroutine is output, a subroutine residence time measurement circuit 27 initiates counting showing the residence time of the subroutine and a recovery indication data is output when the count value reaches a specific value. A sequence control circuit 26 receives the recovery indication data. When a test pattern showing returning from the subroutine to the calling side routine is output, the circuit controls a program counter value so as to returning to the calling side routine. COPYRIGHT: (C)2004,JPO
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