METHOD OF DESIGNING SEMICONDUCTOR DEVICE, METHOD OF INSPECTING SEMICONDUCTOR DEVICE, PROGRAM FOR DESIGNING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a method of designing semiconductor device by which a semiconductor device provided with measuring terminals used for measuring voltages and logical states in wiring connecting circuit blocks to each other. SOLUTION: This method of designing the semiconductor device having a plurality of circuit blocks formed on a semiconductor substrate includes a step of registering the measuring terminals provided with electrodes in the uppermost layer of the device and can be connected to wiring which connects circuit blocks to each other in each layer of the device together with the circuit blocks as cells in a design rule, a step of disposing the measuring terminals and circuit blocks in a plane, and a step of connecting each wiring extended from the circuit blocks to each other through the measuring terminals. COPYRIGHT: (C)2004,JPO