发明名称 Fabrication of self-aligned reflective/protective overlays on magnetoresistance sensors, and the sensors
摘要 A magnetoresistance sensor is fabricated using a sensor structure including a free layer deposited upon a lower layered structure and depositing an oxide structure overlying the free layer. The depositing of the oxide structure includes the steps of depositing a buffer layer overlying the free layer, wherein the buffer layer is a buffer-layer metal when deposited, depositing an overlayer overlying and contacting the buffer layer, the overlayer being an overlayer metallic oxide of an overlayer metal, and oxidizing the buffer layer to form a buffer layer metallic oxide.
申请公布号 US2004105937(A1) 申请公布日期 2004.06.03
申请号 US20020309938 申请日期 2002.12.03
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 KULA WITOLD;ZELTSER ALEXANDER MICHAEL
分类号 G01R33/09;G11B5/31;G11B5/39;G11B5/40;H01L43/08;H01L43/12;(IPC1-7):B05D5/12;G11B5/127;B05D3/02;G11B5/33 主分类号 G01R33/09
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