发明名称 METHOD FOR PRODUCING SILICON SINGLE CRYSTAL DOPED WITH HIGHLY VOLATILE FOREIGN SUBSTANCE, THIS KIND OF SINGLE CRYSTAL, AND SEMICONDUCTOR WAFER MANUFACTURED FROM THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a method with which simple estimation of the required dopant quantity is made possible under predetermined processing conditions without preliminarily analyzing the treatment conditions in detail. SOLUTION: The method for producing a silicon single crystal which is doped with a highly volatile foreign substance comprises pulling the single crystal from a melt which is held under predetermined process conditions in a crucible. A quantity N<SB>o</SB>of the foreign substance is added into the melt in order to achieve a desired resistance of the melt, and after a time t, the melt is after-doped at least once with a quantityΔN(t) of the foreign substance, in order to compensate for the loss caused by the foreign substance evaporating out of the melt. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004149411(A) 申请公布日期 2004.05.27
申请号 JP20030371105 申请日期 2003.10.30
申请人 WACKER SILTRONIC AG 发明人 WEBER MARTIN DR;VILZMANN PETER;GMEILBAUER ERICH;VORBUCHNER ROBERT
分类号 C30B29/06;C30B15/00;C30B15/04;(IPC1-7):C30B29/06 主分类号 C30B29/06
代理机构 代理人
主权项
地址