发明名称 |
METHOD FOR PRODUCING SILICON SINGLE CRYSTAL DOPED WITH HIGHLY VOLATILE FOREIGN SUBSTANCE, THIS KIND OF SINGLE CRYSTAL, AND SEMICONDUCTOR WAFER MANUFACTURED FROM THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a method with which simple estimation of the required dopant quantity is made possible under predetermined processing conditions without preliminarily analyzing the treatment conditions in detail. SOLUTION: The method for producing a silicon single crystal which is doped with a highly volatile foreign substance comprises pulling the single crystal from a melt which is held under predetermined process conditions in a crucible. A quantity N<SB>o</SB>of the foreign substance is added into the melt in order to achieve a desired resistance of the melt, and after a time t, the melt is after-doped at least once with a quantityΔN(t) of the foreign substance, in order to compensate for the loss caused by the foreign substance evaporating out of the melt. COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2004149411(A) |
申请公布日期 |
2004.05.27 |
申请号 |
JP20030371105 |
申请日期 |
2003.10.30 |
申请人 |
WACKER SILTRONIC AG |
发明人 |
WEBER MARTIN DR;VILZMANN PETER;GMEILBAUER ERICH;VORBUCHNER ROBERT |
分类号 |
C30B29/06;C30B15/00;C30B15/04;(IPC1-7):C30B29/06 |
主分类号 |
C30B29/06 |
代理机构 |
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代理人 |
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地址 |
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