| 摘要 |
Circuit has the following characteristics: inputs for receipt of an n-bit measurement value (xp), an n-bit reference value (xi) and an m+1 bit tolerance value (DELTAxq); a testing arrangement (42) for testing the measurement value based on at least one predefined tolerance criterion and; an output unit for output of an output value (xa) that is dependent on the state of the testing arrangement and in particular whether the measurement value has fulfilled the predefined tolerance criterion or not. The invention also relates to a corresponding tolerance analysis arrangement, an IC chip with an electrical tolerance analysis circuit, a needle card for testing IC or semiconductor chips, a load board for holding a needle card, a measurement unit with measurement sensors, a computer system, method and computer program.
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