发明名称 INSPECTION CIRCUIT, ELECTROOPTICAL PANEL AND ELECTRONIC APPLIANCE
摘要 PROBLEM TO BE SOLVED: To reduce the leakage amount of an inspection circuit and to reduce a circuit scale. SOLUTION: Analog switches ASW5-ASW7 are connected between data lines 3-1 - 3-3 and inspection lines T1-T3. In inspection, the analog switches ASW1 and ASW2 are turned on and selection signals SEL and inverted selection signals SELX are supplied to the control terminals of the analog switches ASW5-ASW7. In non-inspection, while the analog switches ASW1 and ASW2 are turned off, since the control terminals of the analog switches ASW5-ASW7 are connected through the analog switches ASW3 and ASW4 to a high potential power source VDD or a low potential power source VSS, the analog switches ASW5-ASW7 are surely turned off. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004151345(A) 申请公布日期 2004.05.27
申请号 JP20020316087 申请日期 2002.10.30
申请人 SEIKO EPSON CORP 发明人 FUJIKAWA SHINSUKE
分类号 G02F1/13;G02F1/133;G09G3/20;(IPC1-7):G09G3/20 主分类号 G02F1/13
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