发明名称 |
MULTIFACETED SAMPLING STUB AND MEASURING METHOD OF PHOTOELECTRON SPECTROSCOPE, MAKING USE OF MULTIFACETED SAMPLING STUB |
摘要 |
PURPOSE: A multifaceted sampling stub and a measuring method of a photoelectron spectroscope, making use of the multifaceted sampling stub are provided to mount a number of samples and to simultaneously bring in a number of samples and measure the samples in a short time. CONSTITUTION: A multifaceted sampling stub(100) comprises plural sample-mounting surfaces(120) parallel to a rotating shaft, and rotation parts. The sample-mounting surfaces are connected around the rotating shaft. The rotation parts are connected to the end of the sample-mounting surfaces. Fixing plates for fixing samples(110) are disposed to the sample-mounting surfaces. The sample-mounting surfaces are connected at an angle smaller than an angle of 180 degrees. |
申请公布号 |
KR20040043987(A) |
申请公布日期 |
2004.05.27 |
申请号 |
KR20020072467 |
申请日期 |
2002.11.20 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, HAENG JA;KIM, SEOK HAN |
分类号 |
G01J3/02 |
主分类号 |
G01J3/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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