发明名称 MULTIFACETED SAMPLING STUB AND MEASURING METHOD OF PHOTOELECTRON SPECTROSCOPE, MAKING USE OF MULTIFACETED SAMPLING STUB
摘要 PURPOSE: A multifaceted sampling stub and a measuring method of a photoelectron spectroscope, making use of the multifaceted sampling stub are provided to mount a number of samples and to simultaneously bring in a number of samples and measure the samples in a short time. CONSTITUTION: A multifaceted sampling stub(100) comprises plural sample-mounting surfaces(120) parallel to a rotating shaft, and rotation parts. The sample-mounting surfaces are connected around the rotating shaft. The rotation parts are connected to the end of the sample-mounting surfaces. Fixing plates for fixing samples(110) are disposed to the sample-mounting surfaces. The sample-mounting surfaces are connected at an angle smaller than an angle of 180 degrees.
申请公布号 KR20040043987(A) 申请公布日期 2004.05.27
申请号 KR20020072467 申请日期 2002.11.20
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, HAENG JA;KIM, SEOK HAN
分类号 G01J3/02 主分类号 G01J3/02
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