发明名称 |
PATTERN MASK FOR LASER CRYSTALLIZATION EQUIPMENT |
摘要 |
PURPOSE: A pattern mask for laser crystallization equipment is provided to improve crystallization characteristics by precisely aligning the crystallization direction of a pattern mask and a substrate, and to improve productivity by using a plurality of patterns only by an alignment process. CONSTITUTION: A laser beam is selectively projected by the pattern mask(6) to perform crystallization of a predetermined shape and direction on a substrate. Horizontal vernier key patterns(6a) are formed in the confronting right-and-left positions of the pattern mask with respect to a center point.
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申请公布号 |
KR20040043310(A) |
申请公布日期 |
2004.05.24 |
申请号 |
KR20020071541 |
申请日期 |
2002.11.18 |
申请人 |
SAMSUNG SDI CO., LTD. |
发明人 |
HAN, GYU WAN;LEE, JONG MIN;MYUNG, SEUNG HO;NOH, CHEOL RAE |
分类号 |
H01L21/26;(IPC1-7):H01L21/26 |
主分类号 |
H01L21/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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