发明名称 PATTERN MASK FOR LASER CRYSTALLIZATION EQUIPMENT
摘要 PURPOSE: A pattern mask for laser crystallization equipment is provided to improve crystallization characteristics by precisely aligning the crystallization direction of a pattern mask and a substrate, and to improve productivity by using a plurality of patterns only by an alignment process. CONSTITUTION: A laser beam is selectively projected by the pattern mask(6) to perform crystallization of a predetermined shape and direction on a substrate. Horizontal vernier key patterns(6a) are formed in the confronting right-and-left positions of the pattern mask with respect to a center point.
申请公布号 KR20040043310(A) 申请公布日期 2004.05.24
申请号 KR20020071541 申请日期 2002.11.18
申请人 SAMSUNG SDI CO., LTD. 发明人 HAN, GYU WAN;LEE, JONG MIN;MYUNG, SEUNG HO;NOH, CHEOL RAE
分类号 H01L21/26;(IPC1-7):H01L21/26 主分类号 H01L21/26
代理机构 代理人
主权项
地址