发明名称 SPECIMEN MEASURING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To measure quantitatively the actual thickness of a portion to be measured, based on image data showing a specimen obtained by radiation photographing, in a specimen measuring apparatus. <P>SOLUTION: The radiant ray photographing makes a radiant ray pass in the thickness direction of a metal plate 1 composed of stated material and a plurality of reference samples 5A, 5B, 5C which are composed of the same material as the metal plate 1 and have known different actual thickness. Image data E1 acquired by the photographing are input from an image input part 35. An image shown by the image data is displayed on a display screen 11. Position on an image of each reference sample is input with an input pen 20. A value of actual thickness of each reference sample is input from a key board. A position of the portion to be measured 2, on an image, where thickness in the metal plate 1 is to be measured is input with a mouse 25. Based on a matched relation between concentration of each reference sample on an image and the actual thickness of each reference sample, an arithmetic means 50A converts the concentration of the portion to be measured 2 on the image into the actual thickness, thereby obtaining a value of the actual thickness of the portion to be measured 2. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004144652(A) 申请公布日期 2004.05.20
申请号 JP20020311005 申请日期 2002.10.25
申请人 FUJI PHOTO FILM CO LTD 发明人 OKANO HIROYOSHI
分类号 G01B15/02;G01N23/04;G06T1/00 主分类号 G01B15/02
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