发明名称 HIGH SPEED RESISTANCE MEASUREMENT SYSTEM
摘要 PURPOSE: A high speed resistance measurement system is provided to save the manpower allocated in the PDP production line and the inspection time as well as to improve the quality of the device utilizing the resistor. CONSTITUTION: A high speed resistance measurement system includes a host computer(100) and a main resistance measurement device(300). The host computer(100) outputs the result in response to the control command inputted to automatically perform the open/short inspection of the plurality of resistors or the trimming operation. The main resistance measurement device(300) automatically performs the open/short inspection of the plurality of resistors or the trimming operation in response to the control command inputted from the host computer(100) and transmits the result to the host computer(100).
申请公布号 KR20040042616(A) 申请公布日期 2004.05.20
申请号 KR20020071177 申请日期 2002.11.15
申请人 WIN TECH CO., LTD. 发明人 RYU, DEUK HYEON
分类号 G01R27/00;(IPC1-7):G01R27/00 主分类号 G01R27/00
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