发明名称 Measuring stray parameters of multiple gate measurement object involves using multi-gate network analyzer with non-sinusoidal measurement signals, determining correction values in calibration process
摘要 The method involves determining correction values in calibration process for use when computing the stray parameters from measured wave parameters. The time offsets between the measurement signals in the measurement channels corresponding to the wave parameters measured at the gates of the measurement object are computed and compensated, uncorrected stray parameters are computed from them and then corrected using the correction values. The method involves determining correction values for the network analyzer in a preceding calibration process and taking them into account when computing the stray parameters from measured wave parameters. The time offsets between the measurement signals in the measurement channels corresponding to the wave parameters measured at the gates of the measurement object are computed and compensated, uncorrected stray parameters are computed from them and then corrected using the correction values.
申请公布号 DE10251551(A1) 申请公布日期 2004.05.19
申请号 DE20021051551 申请日期 2002.11.05
申请人 ROHDE & SCHWARZ GMBH & CO. KG 发明人 MINIHOLD, ROLAND;WEIS, MARTIN;BEDNORZ, THILO;SIMON, HANS-JOACHIM;WINTER, ALBERT
分类号 G01R27/28;G01R35/00;(IPC1-7):G01R27/28 主分类号 G01R27/28
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