发明名称 |
Current measurement circuit and method for voltage regulated semiconductor integrated circuit devices |
摘要 |
A current measurement circuit and method for testing a semiconductor device is provided. The method includes the steps of providing a semiconductor integrated circuit device including a voltage regulating circuit, the voltage regulating circuit being activated as needed to maintain a required voltage level; monitoring the voltage regulating circuit to determine a number of times it is activated during a sample period; and comparing the number of activations to a predetermined limit whereby if the number of activations exceeds the predetermined limit the semiconductor device is defective. The current measurement circuit includes an external clock for providing a clock signal; a first counter for counting when the voltage regulating circuit is activated; a second counter for counting clock cycles of a sample period; and a register for storing the number of activations, wherein the number of activations represents a relative current consumption value of the semiconductor device.
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申请公布号 |
US6737671(B2) |
申请公布日期 |
2004.05.18 |
申请号 |
US20020180254 |
申请日期 |
2002.06.26 |
申请人 |
INFINEON TECHNOLOGIES RICHMOND, LP |
发明人 |
VOLLRATH JOERG;MOORE PHILIP;ZIMMERMANN ULRICH |
分类号 |
G01R31/30;(IPC1-7):H01L23/58 |
主分类号 |
G01R31/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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