发明名称 Composite spacer scheme with low overlapped parasitic capacitance
摘要 A method and composition for a composite spacer with low overlapped capacitance includes a low-k dielectric spacer layer. A first spacer is deposited on a partially formed semiconductor device having a gate oxide stack, followed by a low dielectric constant spacer layer. Anisotropic etching of the combined layers form spacers surrounding the gate oxide stack.
申请公布号 US6737342(B1) 申请公布日期 2004.05.18
申请号 US20030458141 申请日期 2003.06.09
申请人 LSI LOGIC CORPORATION 发明人 LEE MING-YI;CHANG CHIEN-HWA
分类号 H01L21/336;H01L29/78;(IPC1-7):H01L21/336;H01L21/22;H01L21/320;H01L21/31 主分类号 H01L21/336
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