发明名称 Layout techniques for the creation of dense radiation tolerant MOSFETs with small width-length ratios
摘要 A metal oxide semiconductor field effect transistor ("MOSFET") layout with small width-length ratio allows for greater flexibility in design and density in dimension than the conventional annular technique is provided. Accordingly, higher density MOSFET of this layout gives more devices on a single semiconductor wafer. An additional benefit of this layout is a reduced current density at the enclosed terminal wherein there is less localized heating and damages of materials composing the transistor.
申请公布号 US2004089885(A1) 申请公布日期 2004.05.13
申请号 US20030659479 申请日期 2003.09.10
申请人 MARTIN MARK N.;STROHBEHN KIM;FRAEMAN MARTIN E. 发明人 MARTIN MARK N.;STROHBEHN KIM;FRAEMAN MARTIN E.
分类号 H01L29/06;H01L29/10;H01L29/78;(IPC1-7):H01L29/80 主分类号 H01L29/06
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