发明名称 |
Layout techniques for the creation of dense radiation tolerant MOSFETs with small width-length ratios |
摘要 |
A metal oxide semiconductor field effect transistor ("MOSFET") layout with small width-length ratio allows for greater flexibility in design and density in dimension than the conventional annular technique is provided. Accordingly, higher density MOSFET of this layout gives more devices on a single semiconductor wafer. An additional benefit of this layout is a reduced current density at the enclosed terminal wherein there is less localized heating and damages of materials composing the transistor.
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申请公布号 |
US2004089885(A1) |
申请公布日期 |
2004.05.13 |
申请号 |
US20030659479 |
申请日期 |
2003.09.10 |
申请人 |
MARTIN MARK N.;STROHBEHN KIM;FRAEMAN MARTIN E. |
发明人 |
MARTIN MARK N.;STROHBEHN KIM;FRAEMAN MARTIN E. |
分类号 |
H01L29/06;H01L29/10;H01L29/78;(IPC1-7):H01L29/80 |
主分类号 |
H01L29/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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