Oscillation based cycle time measurement

摘要

An embodiment of the invention is circuitry 25 that contains a programmable delay 8 and a pulse generator 16 that send clock signals of a certain frequency to a device under test 1. The programmable delay 8 increases the frequency of the clock signal to the device under test 1 until the device under test fails. The cycle time measurement of the device under test 1 is the period of maximum frequency at which the device under test 1 operates properly.